Carbon Nano Fiber Probe Cantilever
Silicon Cantilevers for AC Mode

Aluminum reflex coating
- OMCL-AC160FS-B2
- (18 chips/box, Pre-separated chips)
- OMCL-AC160FS-Q2
- (3 chips/box, Pre-separated chips)
| Cantilever | |||||
|---|---|---|---|---|---|
| A | B | C | D | ||
| Lever types | - | - | - | ||
| Resonance Frequency fres |
[kHz] | 300
(200 - 400) |
|||
| Spring Constant kz |
[N/m] | 42
(12 - 103) |
|||
| Shape | Rectangular | ||||
| Length × Width × Thickness L × W × T |
[µm] | 160×50×4.6 | |||
| Probe setback※1 D |
[µm] | 0 | |||
| Probe | |||||
|
|||||
| Shape | Tetrahedral with columnar Carbon Nano Fiber Probe | ||||
| Length | [µm] | 14 | |||
| Effective probe length※2 | [µm] | 0.2 | |||
| Tip radius R tip |
[nm] | 10 | |||
| Material | |||||
| Probe apex | Carbon Nano Fiber | ||||
| Lever | Silicon | ||||
| Coating Metal | |||||
| Probe side | Non | ||||
| Reflex side | Aluminum | ||||
| chip | |||||
| type | Silicon Chip | ||||
| Length × Width × Thickness Lchip × Wchip × Tchip |
[mm] | 3.4×1.6×0.3 | |||
| Measurement mode | |||||
| Contact mode | - | ||||
| AC mode | |||||
| Measurement environments | |||||
| In air | |||||
| In water | - | ||||
*1 Positive value of 'Probe setback' means the probe apex extends even further than the apex of the cantilever. Negative value means that the probe apex locates over the cantilever.
*2 Effective probe length (Effective tip height) is defined as a length of distal part from the cantilever of two stage structured probe to clarify the length of the actual probe which smoothly grow in diameter from the probe apex toward the bottom.
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