Carbon Nano Fiber Probe Medium-soft Cantilever
CNF (Carbon Nano Fiber) Probe
Silicon Cantilever with a Carbon Nano Fiber Probe
OLYMPUS CNF series has Silicon Cantilever with a Carbon Nano Fiber Probe.
Carbon Nano Fiber Probes (CNF)
High aspect ratio probe:
The thickness/width of each CNF probe at 200 nm apart from its apex is less than 50 nm. Its aspect ratio is higher than 4. The tip radius of its apex is less than 20 nm, typically 10 nm.
Such fine probe with tip-tilt-compensation enables to access small and deep pits on your sample surface (see images below).
Excellent image-retention:
The rodlike-shaped CNF probe contributes in data quality retention, even worn after the several dozen times of scanning over the rugged samples of a polysilicon thin film. It achieves consistency in the measurement and eliminates the bothersome frequent chip exchange.
Easy-to learn operationality:
CNF are compatible with conventional Olympus standard silicon cantilevers, OMCL-AC160TS and OMCL-AC240TS. The compatibility brings you a stress-free usability from the very first operation.
Check Scan line profile and enlarged view of the tip apex.
Probe
A single CNF probe is formed at the apex of probe support or tetrahedral silicon tip.
Below are SEM images of a CNF probe from the front and side, and the last is a magnified view from the front.
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|---|---|---|---|
| Front | Side | Side (probe apex) | Front (probe apex) |
CNF probe shape : Rod-like CNF with tip tilt compensation at 12 degrees
Probe support : Tetrahedral (tilted)
Probe material : Amorphous carbon (chief material)
Metal coating
[Reflex coating]
Thin aluminum film with the thickness of 100nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected.
Dimension of levers and chip (substrates)
| OMCL- AC160FS series |
OMCL- AC240FS series |
|
|---|---|---|
| L (µm) | 160(±20) | 240(±20) |
| W (µm) | 50(±2) | 30(±2) |
| t (µm) | 4.6(±0.8) | 2.8(±0.8) |
Packaging
Number of chips in a case : 3 chips (-Q2 series) and 18 chips (-B2 series)
Case : Plastic box with a tacky coating
Chip status : Pre-separated
Model name
| Total number of chips | ||
|---|---|---|
| OMCL- AC160FS-Q2 |
OMCL- AC240FS-Q2 |
3 |
| OMCL- AC160FS-B2 |
OMCL- AC240FS-B2 |
18 |
| OMCL- AC160FS-Q2 |
OMCL- AC240FS-Q2 |
||
|---|---|---|---|
| OMCL- AC160FS-B2 |
OMCL- AC240FS-B2 |
||
| Cantilever | Shape | Rectangular | |
| Dimensions (LxWxT, µm) | 160x4.6x4.6 | 240x30x2.7 | |
| Resonance frequency (in air, kHz) | 300 | 70 | |
| Spring constant (Stiffness, N/m) | 42 | 2 | |
| Material | Silicon (4 - 6 Ω・cm) | ||
| Material reflex coating on the back side | Aluminum | ||
| Probe-support | Shape | Tetrahedral | |
| Length (µm) | 14 | 15 | |
| Material | Silicon | ||
| Probe (CNF Probe) |
Length (µm) | 0.2µm or longer | |
| Tilt angle | Tip tilt compensation 12 degree (±6 degrees) | ||
| Width (200nm from apex, nm) | 50 | ||
| Tip radius (nm) | 10 (typ.) | ||
| Material | Amorphous carbon | ||
| Chip | Shape | Trapezoidal cross section, Round chip-shoulder | |
| Dimensions (LxWxT, mm) | 3.4x1.6x0.3 | ||
| Packaging | Chip configuration in the box | Pre-separated chip | |
| Storage box | Plastic box with a tacky coating | ||
| Data attached | SEM image (3 chips) | ||
Miscellaneous
- Care for Static shock (see an example of tip damage)
The sharper tip needs the more careful handling to prevent static damage to the tip. Use of an anti-electrostatic mat and a wrist band are recommended as when handling laser diode chips. Handling under an ionizer is also recommended.
Please avoid wearing clothes like woolen sweaters, fleece etc when handling the cantilever cases and chips. - Every good cantilever meets the specifications.
- FAQs on AC (dynamic) mode cantilevers (here)
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