Low-Wear Silicon Nitride Cantilever
Silicon Nitride Cantilevers

Gold reflex coating
- OMCL-HA100WS-HW
- ((245chips/box), Strip Type)
- OMCL-HA100WS-1
- (34 chips/box, Strip Type)
| Cantilever | |||||
|---|---|---|---|---|---|
| A | B | C | D | ||
| Lever types | - | - | - | ||
| Resonance Frequency fres |
[kHz] | 160
(130 - 220) |
|||
| Spring Constant kz |
[N/m] | 15
(7.7 - 23) |
|||
| Shape | Rectangular | ||||
| Length × Width × Thickness L × W × T |
[µm] | 108×50×2.0 | |||
| Probe setback※1 D |
[µm] | -4 | |||
| Probe | |||||
|
|||||
| Shape | Wedge Two protrusions | ||||
| Length | [µm] | 0.2 | |||
| Effective probe length※2 | [µm] | 12 | |||
| Tip radius R tip |
[nm] | 15 | |||
| Material | |||||
| Probe apex | Si3N4 | ||||
| Lever | Silicon Nitride | ||||
| Coating Metal | |||||
| Probe side | Non | ||||
| Reflex side | Gold | ||||
| chip | |||||
| type | Glass Chip | ||||
| Length × Width × Thickness Lchip × Wchip × Tchip |
[mm] | 3.7×1.6×0.51 | |||
| Measurement mode | |||||
| Contact mode | |||||
| AC mode | |||||
| Measurement environments | |||||
| In air | |||||
| In water | |||||
*1 Positive value of 'Probe setback' means the probe apex extends even further than the apex of the cantilever. Negative value means that the probe apex locates over the cantilever.
*2 Effective probe length (Effective tip height) is defined as a length of distal part from the cantilever of two stage structured probe to clarify the length of the actual probe which smoothly grow in diameter from the probe apex toward the bottom.
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