Silicon Nitride Cantilevers
Small Spring Constant Silicon Nitride Cantilevers
Silicon nitride cantilevers with a small spring constant offer high sensitivity for contact mode measurements of weak forces and AC mode measurements of specimens in water.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Standard Silicon Nitride Cantilevers
Widely used in contact mode measurements, due to the cantilever softness and probe wear resistance. Each chip has two triangular cantilevers of differing lengths (100 μm and 200 μm).
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Rectangular Silicon Nitride Cantilevers
Each chip has four cantilevers with different stiffness, suitable for LFM measurement. Simple rectangular cantilever shape facilitates calculation of its mechanical properties with analysis formula.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
OMCL-TR800PB-1
OMCL-RC800PB-1
Gold deposited Small Spring Constant Silicon Nitride Cantilevers
Silicon nitride cantilevers with gold-coated surfaces on both sides, for probe surface modification and electrical measurement.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Low-Wear Silicon Nitride Cantilever
Low-wear Si3N4 probe, recommended for routine measurements, such as thin film inspection of semiconductors where reproducibility is required.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
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