Silicon Cantilevers for AC Mode
High Aspect Ratio Silicon Probe
Conventional Silicon Probe
Standard Carbon Nano Fiber Probe Cantilever
Features a carbon nano fiber (CNF) probe formed at the apex of the silicon probe support. Produces scanned images with excellent reproduction by the rod-shaped probe.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Medium-soft Carbon Nano Fiber Probe Cantilever
Features a carbon nano fiber (CNF) probe formed at the apex of the silicon probe support. Produces scanned images with excellent reproduction by the rod-shaped probe, suitable for soft samples.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Blade Tetrahedral Probe Silicon Cantilever
Features a sharper, blade-like tip with a 7:1 aspect ratio viewed along the cantilever axis, suitable for groove depth measurement.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Standard Silicon Cantilever
TipView design, resonance frequency of 300 kHz (norminal) and spring constant of 42 N/m (norminal) with conventional chip.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Medium-soft Silicon Cantilever
Resonance frequency of 70 kHz (norminal) and spring constant of 2 N/m (norminal) with conventional chip.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Silicon Cantilever for Electrical Measurement
Platinum-deposited Silicon Probe with conventional chip.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
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