New Silicon Cantilevers for AC Mode
1. TipView Design : for exact probe positioning
2. New Concept Chip : easy to handle with tweezers
3. Low Resistive Silicon : for anti-electrostatic charge
OMCL-AC55TN-R3, OMCL-AC55TN-B3
High Resonance Frequency Silicon Cantilever
The cantilever with resonance in mega hertz range enables high speed measurement. Low thermal noise vibration of the cantilever enables unprecedented resolution.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
OMCL-AC160TN-R3, OMCL-AC160TN-C3
Standard Silicon Cantilever
Acclaimed 'TipView' structure, enabling easy probe positioning at the exact point of your interest. Resonance frequency of 300 kHz (norminal) with spring constant of 26 N/m (norminal). Stiffer middle cantilever to minimize　damage to samples.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
OMCL-AC200TN-R3, OMCL-AC200TN-C3
General Purpose Silicon Cantilever
Mid-range mechanical properties with 150 kHz (norminal) resonance frequency and 9 N/m (norminal) spring constant, for measuring surface profile and topology of samples with a wide range of hardness.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
OMCL-AC240TN-R3, OMCL-AC240TN-C3
Medium-soft Silicon Cantilever
Spring constant of 2 N/m (norminal) is smallest of silicon cantilevers, suitable for observing surface topography and viscoelasticity of soft samples.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
Silicon Cantilever for Electrical Measurement
Medium-soft Silicon Cantilever with platinum-deposited probe for enhanced electrical characteristics of samples.
Measurement Environments Water Mode
Measurement Environments
Usable in varying measurement environments in water.
Measurement Environments Air Mode
Measurement Environments
Usable in varying measurement environments in air.
Measurement Modes Contact Mode
Measurement Modes
Soft cantilever for contact mode.
Measurement Modes AC Mode
Measurement Modes
High resonance frequency cantilever for AC mode.
Detection Signals Electrical Measurement
Detection Signals
Cantilevers for measuring electrical characteristics in addition to surface irregularities.
Detection Signals Friction Measurement
Detection Signals
Cantilevers for measuring friction in addition to surface irregularities.
Detection Signals Force Curve Measurement
Detection Signals
Cantilevers for measuring force curve in addition to surface irregularities.
Mechanical Properties
Mechanical Properties
Range of cantilevers from 0.006-85 N/m and 11-1600 kHz.
New Concept Chip
New Concept Chip
Perpendicular chip sidewalls greatly facilitate tweezer grabbing and handling.
TipView Design
TipView Design
Sharp probe is placed at the very end of the cantilever. TipView design facilitates exact probe positioning.
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